Used ZEISS EVO 50H #82084 for sale

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ID: 82084
SEM Electron Beam: Tungsten Specimen Stage: 5 axis Motorized XY: 100mm x 125mm, z=55mm Tilt 0 to 90, R=360 Detectors: Sec - Everhart Thornley Bse - Quad Solid State Analytical: EDX Ready Computer/Software: Windows XP OS Vacuum System: Turbo - Air cooled Can be inspected 2008 vintage.
ZEISS EVO 50H Scanning Electron Microscope (SEM) is a high-performance, cost-effective solution for imaging, measuring and analyzing small particles at high magnification. It is equipped with twin energy-dispersive X-ray spectrometers (EDS), providing simultaneous analysis of elemental composition in a single scan. EVO 50H also has the capability to automatically detect and measure the particle size and shape of even the smallest particles over a wide range of magnifications. In addition to its enhanced performance, ZEISS EVO 50H is designed to be easy-to-use, with intuitive and programmable controls, making it suitable for both experienced and novice users. Its Intuitive user interface for setup and analysis of samples is optimized for use with multi-purpose and multi-media interactions to support efficient sample analysis. EVO 50H's advanced features include a large chamber, allowing for easy specimen manipulation, advanced imaging techniques such as ptychography and mapping, and automated image processing. Its advanced technology includes a high-resolution, high-definition camera, coupled with a motorized stage, allowing for fast and accurate image acquisition and sample navigation. Furthermore, ZEISS EVO 50H also includes advanced sample manipulation features, such as motorized and auto-focus capability, allowing for quick, safe and accurate sample movement. Finally, EVO 50H is equipped with software tools to manage and analyse data, providing users with the capabilities to generate high-quality images and data sets for analysis. All data analysis is stored within ZEISS EVO 50H, eliminating the need for external data storage and enabling efficient data comparison. Furthermore, EVO 50H offers a variety of post-processing options and image analysis programs, allowing for efficient sample characterization. In summary, ZEISS EVO 50H Scanning Electron Microscope provides users with an advanced, reliable and cost-effective tool for imaging, measuring and analyzing small particles for a variety of applications. Its intuitive user interface, advanced imaging techniques, auto-focus and sample manipulation features, coupled with comprehensive software tools, provide both experienced and novice users with a comprehensive SEM solution.
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