Used ZEISS EVO MA10 #9377691 for sale
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ID: 9377691
Scanning Electron Microscope (SEM)
5-Axis controller
Turbine molecular pump
X-Y Sample table travel
Optical system:
Light wire source
Automatic electronic gun
Automatic centering
Manual and automatic focus function
3-Stage lights
Acceleration: 0.2-30kV, 10 V
Electron beam displacement: ±20 pm
Magnification: 7-1,000,000x
Resolution:
3.0 nm at 30 kV
3.5 nm at 30 kV
Probe current range: 0.5 pA - 5 pA
True empty system:
Air pump:
Scroll moduler
Mechanical
True space: Better than 2x10^-4 Pa
Range: 10 Pa-133 Pa
Pumping time: <3 minutes
Sample room type: Rigidity, round, thick wall, sample
Sample room inner size: 310mm(p) x 220mm
Diameter: 230mm
Height: 100mm
Maximum weight allowable: not less than 5kg
Sample table moving mode: 5 axis
Sample table moving range: X=80mm, Y=100mm, Z=35mm, T=-10°-90°, R=360°,Z-35mm, T=-10°-90°, R=360°
X-ray analysis conditions: Exit angle 35 degrees
Analysis working distances: 8.5-20mm
Detection imaging system
Air two time electronic detector
Back scattering electronic detector with line spectrometer interface
Scanning mode:
Full screen
Selection
Point
Line scanning
Linear profile
Scanning rotation
Tilt compensation
Image resolution: 3072 x 2304 pixels (maximum)
Image control:
Resolution mode
Depth view of mode
Analysis mode
Field of view mode
Operating system: Windows 7
Display: 24" TFT.
ZEISS EVO MA10 is an advanced scanning electron microscope (SEM) designed for research and industrial applications. It features an advanced column construction, which provides improved mechanical stability and vibration isolation, ensuring precise imaging. The instrument is able to acquire images of samples with resolutions up to 1 nm and capture highly detailed sub-micron structures. The reduced accelerating voltage of 0.2 to 30 kV enables the installation of high-end detectors for wide range spectrum analysis from X-rays to backscattered-electrons to imaging of large sample coverage with pinpoint accuracy. In addition, the system's generous working distance (up to 194 mm) gives users more flexibility when imaging. It has a large chamber opening at a diameter of 275mm, enabling a wide field of view and consequently, multiple specimens on the grid. The SEM comes with field-of-view, which can be easily adjusted from 5 um x 5 um to 1 mm x 1 mm. The High-Angle Annular Dark-Field (HAADF) detector and the unique combination of a large Field Emission Gun (FEG) and a high-end electron gun assembly enables the user to resolve even the smallest details, giving enhanced imaging performance. The fast scanning speedsand real-time image manipulation capabilities ensure a low-noise, high-resolution image. The hardware and software components of ZEISS EVO MA 10 are well suited for applications such as high-end research and failure analysis. The user-friendly software components include intuitive controls, single mouse click data acquisition and automated image enhancement. Automated image analysis and advanced imaging technologies such as energy-dispersive spectroscopy and electron backscatter diffraction provide further capabilities for complex materials characterization. The instrument is also capable of non-destructive imaging through in-situ X-ray microanalysis. In conclusion, EVO MA10 is a powerful, compact and accurate scanning electron microscope that provides superior resolution and performance. It offers a wide range of imaging modes along with automated image analysis capabilities for failure analysis and other research applications. The ease of use, the flexibility it provides as well as the versatility of being able to image small or large samples make it one of the premier SEMs available today.
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