Used ZEISS / GEMINI Supra 55 DCG-Z #9260646 for sale

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ID: 9260646
Vintage: 2012
Field Emission Scanning Electron Microscope (FE-SEM) With EBC HAS and TCP upgraded 2012 vintage.
ZEISS / GEMINI Supra 55 DCG-Z Scanning Electron Microscope is a powerful tool for high-resolution imaging and analysis of surface features of materials. This equipment features a variable pressure chamber and super finely-crafted optics, providing high resolution SEM imaging that can reveal intricate details of the sample surface. It provides an impressive depth of field and depth of focus and can distinguish fine differences in height and contrast. This system is suitable for a range of applications and industries such as metallography, materials science, nanotechnology, and semiconductor research. ZEISS Supra 55 DCG-Z Scanning Electron Microscope is equipped with a large field of view and a high scan rate, making it suitable for a range of applications that require fast, accurate imaging and analysis. Its high efficiency, resolution and spatial resolution enhances the performance of the unit by far. This machine is also equipped with Confocal Imaging tool and contrast enhancement features, allowing for even greater detail in the imaging of samples. This asset has a field emission gun, which provides superior imaging and accuracy over standard SEM technologies. Its variable pressure chamber also provides optimal performance, enabling it to monitor and maintain high-resolution imaging. With its micro-focused gun, it can accurately identify and distinguish between individual particles and features on the same sample. GEMINI Supra 55 DCG-Z Scanning Electron Microscope is a versatile model that is highly customizable to the user's needs. It is equipped with a range of detectors that can be used to improve the imaging process and accuracy, including a combined EDX/WDX detector, EDS detector, and Everhart-Thornley detecctor. It also has a range of automated process stages, such as sample stage, objective lens control, and imaging control. These features, coupled with its user-friendly interface and a range of specimen holders, make Supra 55 DCG-Z Scanning Electron Microscope an ideal equipment for laboratory and industrial research needs. As an all-purpose imaging tool, this system is an excellent choice for high-resolution SEM imaging. It boasts superior accuracy and image clarity, allowing it to capture and analyze intricate details of the sample surface, with superior reliability and repeatability.
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