Used ZEISS Gemini #9249507 for sale

ZEISS Gemini scanning electron microscope (SEM) is a scanning electron microscope specifically designed for a wide range of imaging, from small area analysis to very large area sample overviews. It is a very versatile tool which can be used to image the surface of a variety of materials, including metals, plastics and organic substances. The SEM can be used to observe the physical and chemical properties of specimens in great detail. Gemini SEM also has the ability to image with high resolution for detailed analysis. The SEM uses an electrostatic lens to focus the electrons emitted from the specimen on to the image detector, this generates an image of the sample surface. ZEISS Gemini SEM offers a wide range of imaging parameters to customize the image to the user's needs. The SEM offers both high performance secondary electron (SE) imaging and backscattered electron (BSE) imaging capabilities. The SE image is suitable for observing the surface topography of the specimen and the BSE image is suitable for chemical contrast imaging. Gemini SEM also has the ability to capture more detailed analytical information. It includes integrated energy dispersive X-ray spectroscopy (EDS), which can be used to determine the elemental composition of the sample. The SEM also comes with a range of automated image acquisition and analysis capabilities such as particle analysis and 3D volume imaging. These automated analysis capabilities can be used to quickly and easily capture information about the sample's microstructure. ZEISS Gemini SEM is a reliable and robust tool for imaging and analysis. It is also highly user-friendly and the automated features enable users to quickly and accurately capture images and data. This makes Gemini the ideal tool for a wide range of analysis and imaging needs.