Used ZEISS LEO 1530 #9281289 for sale

ZEISS LEO 1530 is a scanning electron microscope (SEM) typically used for imaging and analyzing microstructures of biological and non-biological samples. It offers a comprehensive range of features and capabilities to serve a variety of imaging tasks and applications. LEO 1530 delivers a high resolution imaging of up to 6.5 nm and a large field of view with a large 30 cm specimen chamber. This scanning electron microscope is equipped with an Everhart-Thornley secondary electron detector, a combination of backscattered detector and the patented dual-axis in-lens secondary electron detector. It is also equipped with a field emission gun (FEG) for high current and low beam voltage to achieve superior imaging performance. In addition, it features the patented ICLE detector to empower energy-dispersive spectroscopy (EDS) and energy filtering systems for a more precise analysis. ZEISS LEO 1530 combines versatile hardware with modern software to achieve various types of imaging and analysis jobs. It is powered with Ez-SE viewing and ZEISS ZSYS imaging software designed to support a range of analytical capabilities, such as elemental analysis, implant characterization and metallography. It is also integrated with the optional contamination sensor to prevent sample damage caused by contamination. The analytical performance of LEO 1530 is further enhanced by several automated functions, such as the correlative imaging system which combines optical and SEM images and the extended depth of field functionality to combine in-focus images at different depths for 3-dimensional imaging. It also offers a fully automated sample loading and handling system to save time and increase productivity. In summary, ZEISS LEO 1530 is a powerful imaging tool that combines high resolution imaging and large field of view imaging with advanced software, automated functions, and various analytical capabilities to facilite imaging and analysis of a wide range of samples.