Used ZEISS Merlin #9098445 for sale

ZEISS Merlin is a scanning electron microscope (SEM) with low-vacuum technology for comprehensive imaging, analysis and metrology. Merlin is well suited for visualization of the topography, complex contours and surface structures of a wide range of materials such as ceramics, plastics, metal, composites and much more. The electron beam of ZEISS Merlin is produced in a field-emission presource, which provides superior beam homogeneity and brightness. The microscope also features high resolution imaging capabilities that enable detail-rich images of even the smallest details. Merlin also incorporates SPM (Scanning Probe Microscopy) that provides a complete range of imaging modes, including force spectroscopy, phase imaging, electrical and thermal scanning, and drift-compensation technology. ZEISS Merlin is also equipped with a field ion microscopy (FIM) mode, which enables crystal orientation determination and imaging of the surface structure of larger samples. Merlin also utilizes a highly efficient liquid nitrogen cooling system. This enables effective cooling of samples for ultra-high resolution imaging and analysis even at the highest magnifications. The microscope's objective lens assembly also enables an electrostatic field for optimized focusing. Moreover, ZEISS Merlin provides exceptional analytical features in terms of chemical and imaging. Its accelerated and decelerated electron detector allows for efficient imaging, analysis and spectroscopy with an electron beam bombardment of various materials. Additionally, Merlin provides fast and sensitive imaging modes such as energy dispersive spectroscopy (EDS) and electron energy loss spectroscopy (EELS). The EDS and EELS modes enable the user to identify and quantify trace elements in a sample and determine its elemental composition. Combined with its intuitive graphical user interface, ZEISS Merlin is an extremely versatile and invaluable laboratory tool that offers superior quality results, reliable performance and flexible usage combined in one instrument. As such, it makes an ideal choice for comprehensive sample imaging, analysis and metrology for a wide range of applications.