Used ZEISS Sigma #9316549 for sale

ZEISS Sigma is a scanning electron microscope (SEM) that provides high-resolution imaging and analysis capabilities. The SEM is used to analyze physical properties of materials on the nano- to microscale, including topology, composition, crystallinity, and microstructure. Sigma features an in-lens energy dispersive x-ray detector (EDS) that provides the ability to identify the elemental composition of materials. This allows for elemental and chemical mapping of samples, providing insight into their component materials and correlating to complex physical properties. ZEISS Sigma provides high resolution imaging up to 1nm, allowing users to resolve details previously not possible. Its enhanced resolution is obtained using an in-lens electron optics design, which reduces aberrations, leading to sharper images as more electrons are focused onto the sample. The SEM offers automated features such as automated scanning and autofocus. Autofocus is needed when looking at samples of various thicknesses, as the electron lens requires adjustment to focus the resulting image. The auto-scanning feature allows for automatic capture of multiple images at set time intervals, reducing the time spent on sample examination and shifting the focus to image interpretation. In addition, Sigma offers tilt and rotational movement capabilities for viewing samples from multiple angles. The tilt capability is especially useful for materials characterization since it allows users to take into account three-dimensional effects such as crystal structure alignment, allowing interpretation of data at the nano- and microscale. The interface of ZEISS Sigma is designed with intuitive operation and customizable settings, making it simple and easy to use. Furthermore, the microscope can be attached to a personal computer for saving and manipulating data. This makes data sharing and archiving simple and efficient. Overall, Sigma is an excellent and advanced scanning electron microscope. Its superior resolution, automated operation, and intuitive interface make it an ideal tool for materials characterization and analysis.