Used ZEISS Supra 25 #9119319 for sale

ZEISS Supra 25 is a high-performance scanning electron microscope (SEM) designed for maximum performance and flexibility. The equipment is equipped with an ultra-high-resolution cold-start detector, making it ideal for imaging small and very complex features on a wide variety of samples. The microscope is equipped with a novel automated sample loading and unloading system that is controlled from the main console. An integrated feedback loop in the scan software provides instant feedback for optimal alignment and focusing of the samples. The high-end magnification range of Supra 25 is suitable for microstructural applications in materials science, engineering, and forensics. The microscope is capable of collecting data from samples down to 1nm in size, providing ultra-high resolution images and data. ZEISS Supra 25 has an extremely wide field of view, enabling users to image volumes of up to 90mm in diameter and collect simultaneously higher depth of field. With a working distance of up to 250mm, the unit is also capable of imaging large and complex structures. The microscope is equipped with an environmental lifetime module (ShokoSEM) for low-voltage SE imaging and SECOM/E microtomography. The SEM is equipped with a full suite of analytical tools, including energy-dispersive X-ray spectroscopy (EDS), X-ray mapping, and backscattered electron imaging and signal analysis. These tools can be used to identify and characterize a wide variety of sample materials, including metals, dielectrics, and semiconductors. Additionally, Supra 25 is capable of scanning multiple samples in parallel, making it an ideal choice for high-throughput imaging. The software that drives ZEISS Supra 25 is open and intuitive, allowing users to quickly and easily navigate the user interface and adjust parameters to optimize image quality. The machine also includes automatic tool diagnostics and error correction for maximum performance. The modularity of the microscope makes Supra 25 an ideal choice for high-throughput imaging of a variety of samples.