Used ZEISS Ultra 55 #9194483 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
![ZEISS Ultra 55 Photo Used ZEISS Ultra 55 For Sale](https://cdn.caeonline.com/images/zeiss_ultra-55_843362.jpg)
![Loading](/img/loader.gif)
Sold
ID: 9194483
Scanning electron microscope (SEM)
High resolution mode: 20nA
Oil free pumping system: XDS10 (220-240V)
Operating system: Windows with keyboard
Control panel USB
US Vers with firmware
Flange kit: 4QBSD, 55 / 55VP / UltraPlus
Airlock programed, 80mm
(3) Multiple single stub holder 4
Multi-purpose sample holder
Faraday cup
USB Dongle
X-Ray / External scan input panel kit
Flat panel TFT color monitor, 19"
Mechanical adapter: BRUKER AXS Detectors
Air compressor with auto drain
THERMOCUBE 400 W, 3 lpm Gear chiller
AVI-400 Extra MP active vibration isolation
Field view: Fibics atlas
EVO Hi-res imaging for FESEM
LCD TFT Monitor: HP ZR2440w
Shuttle / Find EM
AV4 Mod LM-EM Site Lic.
ZEISS Ultra 55 is a scanning electron microscope (SEM) capable of producing high resolution images and extremely precise measurements on a wide range of samples. It is an effective laboratory instrument that enables users to observe, measure and analyze materials with nanometer-level accuracy. Ultra 55 is a digital imaging and analysis equipment that combines variable pressure and conventional electron microscopy mode. It can be used to observe large area specimens in variable pressure mode, which reduces the surface charging effect. The instrument is suitable for imaging industrial and research grade semiconductor wafers and other devices, such as MEMS, bio-sensors and consumer electronics. The semiconductor mode and automatic optimization of accelerating voltage and working distance provide superior image quality with resolution as high as 0.7 nm. The system is equipped with the world-renowned twin lens technology, which enables the user to conduct high-resolution imaging in all directions. Moreover, the five-stage energy filter maximizes the signal-to-noise ratio to accurately identify and measure feature dimensions. ZEISS Ultra 55's flexible capabilities make it ideal for material characterization. The high-resolution imaging and accurate measurements are suitable for investigating composition, surface topography, defect metrology, and other features of a wide range of materials. The instrument's nanoscale capabilities make it perfect for benchmarking the lithography performance of materials. The intuitive user interface of the instrument provides shortcuts to pre-defined functions. Moreover, the unit is capable of automated image acquisition, allowing for batches of images to be taken with a single command. The unique design of Ultra 55 combines analytical and imaging capabilities into a single package for efficient and precise characterization of materials. This machine is suitable for research and industrial markets and can be easily combined with other instruments for even more capabilities.
There are no reviews yet