Used BAUMANN CENBLA-1000344 #9049901 for sale

ID#: 9049901

Manufacturer:

BAUMANN

Equipment Details:

Wafer inspection unit

Semilab WMT-3:
Inline thickness and resistivity measurement
(3) measurement heads
Non contact method: eddy currents
Integration into stack splitter

GP SOLAR WAF-Q Cam:
Samples to be measured: Monocrystalline, Multicrystalline and Cast-Mono wafers and cells, Square or pseudo square
Wafer size: 100 - 156 mm
Camera model: 4M Matrix, optional 11M Matrix
Defect resolution: 80 µm / 60 µm
Measured features: Geometry, Contour and surface defects, Chipping defects
Stand Still time: 25 ms / 25 ms
Minimum cycle time: 1 s
Geometrical and surface wafer inspection
Intrusions into the outer contour :150 µm
Chipping: 300 µm
General surface defects: 2 mm
Cracks and holes: 200 µm

2011 vintage.
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