Used CHIPTEST B1-ATE #293655268 for sale

CHIPTEST B1-ATE is a wafer handler designed for testing and characterizing integrated circuits. It is a complete solution for handling and testing wafers up to six inches in diameter including die-bonding, small die-placement, thin-film testing and contact probing. The equipment consists of a wafer-handling controller and a wafer-handling robot which can be operated either manually or using automation. Its automation control system offers complete control of robot movements, allowing users to adjust the acceleration, speed and angle of robotic arms. This unit is also equipped with two pneumatic clamp arms for handling delicate wafers during loading and unloading. The machine's wafer-alignment function automatically adjusts the position of wafers relative to the testing head, providing accurate wafer-level testing. The testing head is equipped with pneumatic probes which can be used to test, measure and characterize electrical signals on micro-sized chips with precision. This is achieved by adjusting the force and speed of the probe needles, allowing them to accurately penetrate the media to probe for electrical signals. Additionally, the testing station is equipped with a rotating head to enable fast and reliable sample-to-sample testing. B1-ATE also incorporates a cutting and scoring machine which is able to use scribe tools to slice and etch wafers down to required sizes. This tool can also measure template holes on wafers, enabling it to accurately detect die edges. Overall, CHIPTEST B1-ATE is an advanced wafer handler that provides users with reliable and precise testing capabilities. Its automation control asset allows for efficient handling and testing of wafers, while its cutting and scoring model can accurately slice wafers down to size. With its ability to measure template holes, this machine is capable of providing precise and accurate test results.