Used WANGSHA TECHNOLOGY LEDA-AS M76F #9394064 for sale

WANGSHA TECHNOLOGY LEDA-AS M76F is a high-precision wafer handler designed for quality assurance tests and measurements in semiconductor manufaturing. This sophisticated wafer handler boasts powerful automation features that allow it to manage the handling and measurement of up to 48 wafers. It can detect a wide variety of wafer sizes and orientations, up to 8-inch diameters, with its precise multi-point recognition equipment. This system also utilizes a powerful optical recognition unit, which can identify wafer types and classes. LEDA-AS M76F is also equipped with advanced laser interferometry capabilities for high-precision measurements. This technology can achieve a resolution of up to 10 nanometers, allowing it to accurately measure the size, surface features, and angles on the wafer surface. This ensures that the final product meets high-quality manufacturing standards. The wafer handler also includes a high-speed wafer loading and unloading machine that can accommodate up to 40 wafers per minute, while its powerful automated handling tool can process up to 48 wafers at a time. WANGSHA TECHNOLOGY LEDA-AS M76F also comes with a fully integrated vision asset that can detect defects and variations in wafer surfaces. This model can detect defects and variations that are not visible to the human eye, ensuring maximum accuracy in the finished product. In addition to automated wafer handling, LEDA-AS M76F also features an integrated built-in scanner equipment. This system can be used for accurate scanning of material information and include detailed 3D mapping of the wafer's surface. This unit can also be used to measure the physical and electrical characteristics of the wafer and compare it with the desired production parameters. WANGSHA TECHNOLOGY LEDA-AS M76F is an ideal solution for ensuring high-precision quality control in the semiconductor manufacturing industry. This robust wafer handler provides powerful automated features that can easily assure the highest quality standards, while its integrated scanning and vision systems can detect and measure even the smallest variations and defects in the surface. With its powerful combination of automated features and precise optical monitoring, LEDA-AS M76F is an unbeatable choice for high-precision wafer measurement.