Used NIKON NSR 4425i #293602288 for sale

NIKON NSR 4425i is a semi-automated, highly sensitive 5-axis immersive scanner designed to produce superior images of semiconductor wafers. Its advanced optical design and advanced imaging technology provides excellent image quality with high resolution and low distortion. Its high-end automation and accuracy makes it ideal for a variety of applications. NIKON NSR-4425I features a 5-axis optical equipment, dual laser illuminators, high-speed scanning motors, and a high-resolution 5-megapixel detector. The scanner is capable of scanning up to 28mm diameter samples and can be programmed for up to 25 different exposure conditions. It has a fast scan speed of up to 200mm/sec and a high resolution of up to 0.3µm/pixel. NSR 4425 I features a unique Image Immersion Defect Imaging System (I2D). This unit allows for more accurate detection and analysis of defects. It has advanced algorithms to detect and analyze particle defects, grain boundary defects, and other defects. With the I2D machine, the user can review images in double speed, quadruple speed, and with 36x magnification. NIKON NSR 4425 I offers an automated programmable environment. It enables quick and easy job setup and programming, with downloadable programs and auto job setup. The entire process is automated, allowing the user to set up, operate, and analyze wafers quickly and easily. Its advanced control tool also allows users to save data to a PC or USB drive. NSR 4425i is equipped with a range of user friendly features. It offers automatic exposure and focus correction for the optimum image quality, and auto-focus for faster setup and scanning. NSR-4425I offers performance monitoring, data collection and analysis, as well as remote operation for increased safety and convenience. In conclusion, NIKON NSR 4425i is a highly advanced wafer stepper with a range of features to improve accuracy and productivity. Its advanced imaging technology and automation capabilities make it ideal for a variety of applications, while its user-friendly interface makes it an efficient and convenient tool for wafer scanning operations.