Used NIKON NSR 4425i #9351452 for sale

NIKON NSR 4425i Wafer Stepper is a high performance metrology tool ideal for advanced wafer inspection tasks. It is capable of measuring patterns with a resolution down to 0.5μm using a 20mm x 20mm field of view. This stepper is designed for volume production and inspection in semiconductor fabrication facilities. It features a high throughput of up to 900 WPH per hour and an efficient component layout. NIKON NSR-4425I Wafer Stepper provides superior measurement accuracy and repeatability to ensure accurate and consistent inspection results. This is enabled by Nikons proprietary ALIS (Advanced Light Interferometric Equipment) Technology which enables an automated 6-degrees of freedom alignment concurrently with nanometer level trajectory control. This system significantly reduces pattern measurement cycle time. Additionally, the precision AF Control (Advanced focus Control) Unit provides an optimized auto-focus capability with a further reduced auto-focus execution time which ensures a high level of measurement accuracy. NSR 4425 I Wafer Stepper also features a high performance imaging machine, which provides a variable magnification range from 50X to 400X. This tool can generate images in real time without any latency during the measurement process. The stepper is also capable of high-speed image capturing with a maximum transfer speed of 16 images/second. Additionally, advanced illumination options are available which include dark field, back lighting, oblique lighting, and super-resolve semi-circle lighting. NSR 4425i Wafer Stepper is also equipped with advanced metrology capabilities such as the measurement of critical dimensions and surface flatness. Additionally, it can measure electrostatically formed patterns, gold patterns, and opaque thin lines with high accuracy. This stepper also offers a comprehensive pattern recognition library with built-in pattern matching algorithms. It has a setup window which provides visual guidance for setup and parameter optimization. Overall, NIKON NSR 4425 I Wafer Stepper is a highly reliable, high-performance metrology tool ideal for wafer inspection tasks. It offers superior measurement accuracy, high throughput, and advanced imaging and metrology capabilities. This stepper is an ideal choice for semiconductor fabrication facilities that require superior performance and accuracy during their wafer inspection processes.