Used ACCENT OPTICAL / PHILIPS ECV Pro #9301423 for sale

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ID: 9301423
Vintage: 2004
Profiler Does not include computer 2004 vintage.
ACCENT OPTICAL / PHILIPS ECV Pro is a wafer testing and metrology equipment designed to meet the stringent requirements of semiconductor production. It features a series of optical components and inspections to accurately measure a wafer's physical and electrical parameters, such as gate length and CD measurement, across a range of substrates, including silicon, monocrystalline silicon, and compound materials. The system is a complete automated metrology solution featuring a high-accuracy quantitative wafer analysis unit and optical microscope. The high-accuracy machine provides for the accurate measurement of physical and electrical characteristics on a variety of wafer sizes and substrates, with an error rate as low as 0.05 nanometers. This enables the tool to identify fugitive particles and film defects, as well as provide detailed CD and gate length measurement features that can be used to optimize process control and to identify possibilities for product improvement. In addition to the optical components of the asset, PHILIPS ECV Pro provides extensive data analysis capabilities. By leveraging its comprehensive set of acquisition and analysis algorithms, the model can determine the most efficient product processing and measurement methods by taking into account the various production parameters. It comes with a full suite of software tools, compatible with Windows 98 CMMS and HP 9000 series CPUs, that enable the equipment to provide data analysis, simulation and curve fitting, and deviation analysis features. Other features of ACCENT OPTICAL ECV Pro include defect detection and inspection, multi-die testing, thin film metrology, and through-wafer reflectometry capabilities. It also adds traceability and audit logging functionality, and can be interfaced with third-party systems for remote data analysis and sharing. By connecting with production and engineering systems, it gives users the capacity to receive real-time updates of wafer and process parameters to improve production operations. Overall, ECV Pro is an excellent wafer testing and metrology tool, providing accurate and reliable measurements of physical and electrical parameters in a highly efficient automated system. Its comprehensive feature set enables it to effectively meet the needs of a wide variety of semiconductor production applications.
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