Used ACCRETECH / TSK 902501 #9390981 for sale

ACCRETECH / TSK 902501 is a high quality and high performance wafer testing and metrology equipment. It enables precise testing, measurement and characterization of a wide range of materials and components used for advanced electronic products and systems. The system is able to accurately measure precise electrical characteristics of a wide variety of materials, from wafers to chips. The unit features advanced optical metrology capability that sets it apart from the competition. The laser technology used enables high speed non-contact measurement of wafer surfaces from a wide variety of materials, such as amorphous silicon, gallium arsenide, diamond, and other materials commonly used in the semiconductor industry. With this advanced metrology, the machine is able to accurately measure the electrical and optical properties of samples up to 4mm in thickness and a user can assign an area for measurement from 0.1 to 4mm in size. TSK 902501 is an integrated tool that applies dedicated test heads to measure specific parameters. This versatility makes it suitable for characterization and verification of materials such as transistors, thin film transistors, ultra-thin gate oxides, high-k dielectrics, and more. The asset includes powerful non-contact test head systems for capacitance and CMOS test systems. Capacitance test heads measure DC to 10MHz frequency range for a more accurate evaluation of the capacitance characteristics, while the CMOS heads measure capacitance up to 100MHz. This versatility to take advantage of the high accuracy offered by both test heads makes ACCRETECH 902501 ideal for a range of measurements and evaluations. The model is highly accurate and repeatable while still providing high speed measurement of a wide range of materials. The accuracy and repeatability are both guaranteed with a 3σ uncertainty of less than 0.1 nF, in-plane operation stability less than 0.1 nF change, and 0.001Ω isolation. With the equipment's powered air-floating design, the user can easily and instantly generate measurement results. 902501 wafer testing and metrology system provides a reliable, accurate and productive way to perform precise testing, measurement and characterization of a wide variety of materials used in advanced electronic products and systems. This versatile and powerful unit makes it the ideal solution for semiconductor device design and process optimization.