Used ACCRETECH / TSK E-MF1000-100 #9399112 for sale

ACCRETECH / TSK E-MF1000-100 is a state-of-the-art wafer testing and metrology equipment designed to maximize yield, throughput, and accuracy during the semiconductor fabrication process. It is capable of performing a full suite of wafer testing and metrology services, including wafer mapping, electrical test, and metrology. TSK E-MF1000-100 utilizes an advanced optical structure, which provides superior imaging resolution, enhanced throughput, and reliable performance for precise critical dimensioning and film stress measurement. Its efficient optics design allows for quick and precise measurement of critical line widths, contact loop sizes, and profile depths, enabling precise wafer mapping and defect recognition. ACCRETECH E MF1000 100 comes complete with advanced electrical test capabilities, including multichannel current testing, precise voltage measurement, scan voltage measurements, and multi-fetched data-acquisition units. This enables efficient and accurate testing and validation of devices for the analysis of electrical leakage and process integration non-idealities. E MF1000 100 is capable of supporting a wide range of metrology and metrology-related activities, including stress measurement, dicing thickness measurement and bonding, micro-resistant testing, and wire height measurement. All of these parameters can be accurately measured using a wide variety of measurement techniques, including contact/non-contact probes, flying probes, and capacitive probes. E-MF1000-100 also comes with a fully integrated and automated system platform, which enables it to perform numerous tests and tasks simultaneously, to minimize time-to-market for new products, and to improve yields on already existing production lines. This includes automatic wafer-handling, robotic recognition, and a suite of automated product-loading and testing components. Finally, TSK E MF1000 100 also comes equipped with an advanced software package that provides an unmatched level of control and support during the testing and metrology process. This software package allows users to customize processes to suit specific wafer-level applications, while providing a seamless environment that optimizes device performance and ensures reliable results. In summary, ACCRETECH E-MF1000-100 is an advanced wafer testing and metrology unit designed to maximize yield, throughput, and accuracy in the semiconductor fabrication process. With its state-of-the-art optical structure, full electrical test capabilities, integrated machine platform, and software package, ACCRETECH / TSK E MF1000 100 provides a vast array of capabilities, making it an ideal solution for the testing and metrology needs of the modern semiconductor industry.