Used ACCRETECH / TSK JP/E-RM-S07A #293637884 for sale

TSK JP/E-RM-S07A is an advanced wafer testing and metrology equipment designed to provide quality assurance in semiconductor production environments. The system is composed of an inspection and analysis unit, an integrated detection and measurement unit, and a control and communication unit. The inspection and analysis unit is responsible for the initial quality assurance of raw wafers before they are sent for processing. The unit uses advanced imaging technology to capture high-resolution images of each incoming wafer face, allowing for a detailed quality inspection. The integrated detection and measurement unit is where metrology checks are performed. It contains a mechanical arm and a range of sensors that measure a wide range of wafer characteristics, from overall shape and size to individual element parameters. This unit is also capable of high-accuracy imaging tracking, which allows for the precise visualization of defect characteristics. Finally, the unit's control and communication unit collects data from the other two units and transmits it to a database or other external software systems. This unit also provides the user with an intuitive interface, enabling operators to monitor the entire process in real-time. ACCRETECH JP/E-RM-S07A machine is the perfect solution for any semiconductor production environment in need of reliable quality assurance. By combining precision imaging, high-resolution metrology, and a robust communication infrastructure, this tool is able to streamline and automate the entire process, from incoming wafer inspection to defect characterization and report generation.