Used ACCRETECH / TSK Surfcom 1900SD3 #293652637 for sale
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ID: 293652637
Surface roughness / Contour measurement system
X-Axis: 100 mm
Z-Axis: 400 mm
Stone surface plate: 1000 × 450 mm
Operating system: Windows Vista.
TOKYO SEIMITSU Surfcom 1900SD3 is a wafer testing and metrology equipment that specializes in measuring electrical characteristics of semiconductor wafers. Surfcom 1900SD3 system comes equipped with a variety of measurement technologies that ensure the performance of quality control for the final product. Some of the key technologies included on this unit are optical inspection, electrical characterization, as well as process certification. The optical inspection machine of TOKYO SEIMITSU Surfcom 1900SD3 utilizes a high-resolution CCD camera tool that can detect and analyze defects and feature sizes down to 0.02um. The asset is also capable of measuring single-crystal wafers up to 300mm in diameter. The electrical characterization aspect of Surfcom 1900SD3 measures the electrical characteristics of each wafer. The model utilizes an advanced methodology to collect data on resistance, capacitance, power distribution on the wafer, and other important electrical characteristics. TOKYO SEIMITSU Surfcom 1900SD3 is also equipped with a process certification equipment. This feature conducts tests in accordance with the manufacturer's stated process; analysis of the data is then compared to the outcome of the specified process. Surfcom 1900SD3 is a user-friendly system that also offers remote control access. This allows for remote manipulation of test parameters, as well as remote viewing of obtained results and making real-time changes directly from the center. One of the most beneficial aspects of TOKYO SEIMITSU Surfcom 1900SD3 is its high positional and angular accuracy. This ensures accurate, repeatable testing and measurement of small feature sizes. Not only is this unit accurate, but it is also very fast. It can provide results from wafers up to 200mm in diameter in as little as 30 seconds. Surfcom 1900SD3 is an advanced, reliable machine for testing and measuring semiconductor wafers. With its variety of measurement technologies and high accuracy, it is the perfect tool for quality control and process certification.
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