Used ACCRETECH / TSK Surfcom 590A-64 #9399108 for sale

ACCRETECH / TSK Surfcom 590A-64
ID: 9399108
Wafer surface measurement system.
ACCRETECH / TSK Surfcom 590A-64 is a highly advanced wafer testing and metrology equipment used for the evaluation and analysis of semiconductor wafers, with a particular emphasis on physical surface characteristics. This state-of-the-art system is equipped with a range of sophisticated features, making it an ideal choice for a variety of industries, including semiconductor manufacturing and research and development. TSK Surfcom 590A-64 is able to perform a wide variety of high-precision inspections and tests on a range of nano- and micro-scale materials, including semiconductors, organics and nanomaterials. Its advanced feature set includes ultra-high resolution mapping of wafer surfaces, automated tilt measurement, positional measurements and a powerful light source that is capable of revealing surface detail with blinding intensity. ACCRETECH Surfcom 590A-64 also comes with a powerful visualization unit, allowing users to quickly review samples in 2D and 3D modes. Users can quickly spot surface anomalies or irregularities, and then use the machine's advanced analysis tools to measure individual parameters and compare them to the desired results. The tool's powerful Z-axis scan arm makes it easy to measure and compare different areas of a wafer, while the 65x zoom capability allows for detailed analysis even of the smallest features. Surfcom 590A-64 is powered by a 32-bit operating asset and comes with an integrated communication interface and USB port for easy connection to other devices. It supports a wide range of imaging resolutions, ranging from 0.1nm to 500nm, and is capable of both scanning and contact measurements of wafer surfaces. It also features pan-tilt-rotate capabilities for more precise measurements, making it perfect for more advanced research. Overall, ACCRETECH / TSK Surfcom 590A-64 is a powerful and versatile wafer testing and metrology model capable of providing precise and reliable results.Its advanced feature set and advanced analysis capabilities make it ideal for use in a variety of industries and a valuable asset in any research or development setting.
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