Used ACCRETECH / TSK Win-Win 50-1500 #9298852 for sale

ACCRETECH / TSK Win-Win 50-1500 is a wafer testing and metrology equipment designed for semiconductor device manufacturers. This system is suitable for a wide range of applications, including wafer edge and corner metrology, lumped parasitics measurement, die-for-die defect classification, and defect characterization. It is designed with powerful, advanced features such as high-precision pattern recognition capability, unique multi-sensing technology, and a user-friendly graphical user interface. TSK Win-Win 50-1500 provides a wide range of options for customizing the unit, including multiple laser and optical components, sample positioning components, and environmental parts. Additionally, the machine has various software packages that give users the ability to access data, visualize measurements, and analyze results. ACCRETECH Win-Win 50-1500 is designed to provide highly reliable metrology and testing results on a variety of wafer structures, including wafer backside and front side topography, grain size, and wafer edge inspection. Its Advanced Multi-Sensing Technology (AMT) enables simultaneous measurements of multiple parameters, such as inspection, metrology, and grain size. This tool is also designed for gamma irradiation testing of wafers, including measuring the peak doses and characterizing the dose rate for gamma-irradiated samples. Win-Win 50-1500 also features an integrated optical asset for inspecting wafer backside surfaces and an advanced software package for data analysis and reporting. This model includes an optional shield to protect against electromagnetic interference, reject/retain setup options, and micro-metrology capabilities. ACCRETECH / TSK Win-Win 50-1500 is designed with a robust, user-friendly graphical interface that allows users to access the equipment's advanced features quickly and easily, as well as to configure and customize the system to the user's specific needs. Additionally, this unit is engineered with numerous safety features, such as ESD protection, an anti-vibration machine, and an anti-static tool to protect the asset from damage. Overall, TSK Win-Win 50-1500 is a highly advanced wafer testing and metrology model that is ideal for semiconductor device manufacturers that need reliable and accurate results. It offers a wide range of customizable configuration options, features advanced software packages, and comes with an intuitive user interface. Additionally, it provides numerous safety features and is designed with leading-edge technology to enable users to quickly and easily obtain accurate results.