Used ACCRETECH / TSK / XANDEX X1412 #9029340 for sale

ACCRETECH / TSK / XANDEX X1412 is a wafer testing and metrology equipment which is used to inspect, analyze and measure semiconductor wafers. The system has been designed to provide accurate and repeatable results, with high throughput productivity. TSK X1412 offers an innovative range of options from a single number of testes, with a wide range of load boards and a variety of configurations for specific applications. The unit incorporates a suite of 14 tools including metrology, optoelectronic, electrical, wafer mapping, depth profiling, X-Ray analysis and surface mapping systems. The metrology machine consists of a high resolution microscope that provides detailed images of wafer surfaces and allows for dynamic evaluation of defects, enabling detailed inspection data. It also provides examination of defects or failure analysis of chips. The microscope is capable of detecting sub-micron structures such as most common electrical and mechanical tests. It is also capable of measuring angles and distances with the highest accuracy, allowing for a detailed investigation of the strain distribution for the wafer to be made. The optoelectronic tool of XANDEX X1412 comprises a pyrometer and spectrometer to measure material properties such as the reflectivity and luminescence of the wafer. This asset enables the inspection of organic LED chips and other optoelectronic materials, as well as the analysis of spectral patterns for different LEDs. The electrical model allows for sophisticated electrical testing using a variety of test probes, scans and measurements. The equipment measures the electrical properties of semiconductor devices such as transistors and capacitors, and also verifies the functionality of integrated circuits. X1412 also provides wafer mapping for advanced semiconductor fabrication. High resolution images of wafer samples are taken pixel by pixel to provide detailed evaluation of the spatial distribution of features. This information is used to optimize process design and yield. The depth profiling system provides a full analysis of semiconductor wafer topography. This unit is used for detection of contaminants, defects, anomalies and other features of interest. The results of the measurements can be used to characterize surface and bulk materials in semiconductor devices and to optimize processing. Finally, ACCRETECH X1412 can be upgraded with an X-Ray analysis machine, allowing for the detection of defects and impurities such as particles, cracks and voids in the wafer samples. This tool is used for high quality control of the raw wafers in order to guarantee an increase in yield and an overall improvement in the quality of the finished products. Overall, ACCRETECH / TSK / XANDEX X1412 wafer testing and metrology asset is an advanced and reliable model for inspecting, analyzing and measuring semiconductor wafers. It offers a full range of testing capabilities, with high resolution images, robust electrical testing and the ability to detect impurities and defects. The equipment is ideal for high throughput testing and metrology applications.