Used AEP TECHNOLOGY Nanomap 8018 lite #293662139 for sale

AEP TECHNOLOGY Nanomap 8018 lite wafer testing and metrology equipment is a powerful and reliable solution for wafer testing and metrology. It is designed to provide comprehensive measurement capabilities with a high degree of accuracy and ease of use. Nanomap 8018 lite features a patented one-step wafer testing and metrology system for both silicon and compound wafers. This powerful unit can measure a wide range of wafer properties such as doping concentration, surface roughness, flatness, and more. The machine also features a comprehensive set of parameters for characterization, analysis, and feedback control. AEP TECHNOLOGY Nanomap 8018 lite is designed to maximize throughput with a built-in high speed scan monitor and a high-speed data output port for transferring measurement Results fast. The tool also includes an acrylic cover that protects the measurement chamber from dust and debris. The asset offers a variety of customization options to suit the requirements of different types of wafer testing and metrology. You can choose from either a single-stage or a dual-stage model depending on your application. You can also choose from a range of accessories such as wafer probes, sample holders, and wafer manipulators for even more customized options. The equipment has a built-in intuitive user interface to guide operators through test procedures and parameters. This makes the system suitable for both novice and experienced technicians. The unit is compatible with a wide range of wafer types including silicon, gallium arsenide, indium phosphide, and germanium. It also supports a wide range of sample preparation techniques such as etching, polishing, and the use of microscopy. Nanomap 8018 lite is an ideal solution for wafer testing and metrology. With its high level of accuracy, precision and reliability, and its ability to meet the highest standards of performance, AEP TECHNOLOGY Nanomap 8018 lite is a powerful tool for achieving greater levels of wafer testing and metrology.