Used AEP TECHNOLOGY Nanomap 8018 lite #293662145 for sale

AEP TECHNOLOGY Nanomap 8018 lite is a wafer testing and metrology equipment designed for high-speed fault detection and real-time surface metrology. This system provides unmatched precision, accuracy, and speed, enabling users to rapidly detect and diagnose defects in their wafers with confidence. Nanomap 8018 lite features a high precision xenetech operation scanning unit that provides a high-resolution 3D map of the surface of the wafer with a resolution of up to 8µm. Its large throughput capacity and fast data acquisition rate allow users to quickly scan and measure multiple wafers in minutes. The machine integrates a variety of testing methods such as darkfield, brightfield, and backscattered electron analysis to ensure comprehensive analysis of the wafer defects. In addition to the high-resolution 3D map of the wafer, the tool also provides comprehensive fault detection algorithms for identifying defects such as small scratches, contamination, chip bonding, and more. The algorithm uses machine learning models to identify various types of defects that are difficult to detect visually. This helps to improve the accuracy of the results as well as reduce the time to diagnose the nature of the fault. Moreover, AEP TECHNOLOGY Nanomap 8018 lite features an advanced defect detection algorithm that can identify critical and non-critical defects that may not be visible at a glance. This algorithm is capable of providing additional details about each detected defect such as size, location, and material of the defect. This helps to ensure that all potential defects are identified and evaluated to assess the impact on overall wafer performance. The asset is also designed to easily integrate with other equipment and processes in a cleanroom such as sample cooling, temperature and pressure control, or automated cleaning processes. This enables users to quickly capture overviews of their wafers, verify defects, and diagnose their issues in just a few minutes, thus ensuring a faster and more efficient manufacturing process. Nanomap 8018 lite is the perfect solution for customers seeking speed, precision, and accuracy in their wafer testing and metrology processes. With its high-resolution 3D map of the surface of the wafer, advanced defect detection algorithms, and easy integration with other equipment and processes, this model helps users to reduce their time to diagnose faults, thus improving their wafer quality and performance.