Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4280A #9230389 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4280A wafer testing and metrology equipment is designed with applications for wafer level testing on semiconductor devices. It is designed to support both light and vacuum testing of a vast array of different silicon wafer types. HP 4280A allows for quick scanning of wafers, enabling operators to view quickly and accurately the quality of a given wafer. The system also features a host of metrology capabilities, such as visual inspection, scanning electron microscopy (SEM), atomic force microscopy (AFM), profiling, and X-ray diffraction for detailed measurement and analysis of the micro-structures of a given wafer. AGILENT 4280A features a stage module equipped with 5-axis control for precise and accurate alignment of the wafer. The stage allows for traversing the wafer surface in a lateral or vertical direction in a fully automated mode. The stage can also rotate, tilt, and stage shift the wafer, allowing for easy adjustment of the focal plane for various microscope objectives. The automation of these movements enables fast and precise wafer-to-wafer testing, eliminating human error during testing. HEWLETT-PACKARD 4280A offers a full suite of imaging and metrology capabilities, allowing users to obtain a high level of insight into the properties and micro-structure of a given wafer. The built in profiling unit allows for in-depth, nanoscale analysis of the wafer. The machine comes with an array of high resolution microscopes, enabling detailed inspection of the wafer surface, as well as features such as SEM, AFM, and X-ray diffraction for further detailed analysis of the wafer. KEYSIGHT 4280A also offers a range of testing capabilities. It is capable of measuring signals such as voltage, current, and frequency, as well as a broad spectrum of electrical characteristics, such as leakage current, Switching parameters, and channel-to-channel uniformity of devices. This tool also has a built in thermal cycle asset, enabling precise temperature testing of wafers over a range of temperatures. 4280A wafer testing and metrology model is designed to provide quick and accurate wafer testing and metrology capabilities for advanced wafer applications. It features 5-axis control for precise alignment of the wafer, allowing for uniform testing. This equipment is equipped with a full suite of inspection and metrology capabilities, enabling in-depth nanoscale analysis of the wafer. AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4280A also offers a range of signal testing capabilities, as well as a thermal cycle system for precise temperature testing of wafers. It is a powerful, precision tool for informed wafer development.