Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4280A #9375783 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4280A Wafer Testing and Metrology Equipment is a sophisticated, high performance testing and metrology instrument for use in semiconductor wafer fabrication. It is designed to measure the physical, electrical and electrical characterization of silicon wafers with precision, accuracy, and speed. The system offers a full range of measurement functions such as doping profiling, electrical characterization, defect and parametric testing, surface roughness analysis, oxidation testing, photoresist testing, moisture testing, and defect inspection. The unit includes a fast scanning, wide-area imaging and metrology unit for direct imaging of wafer topography and surface features. The Metrology Toolset provides detailed dimensional measurements for oxide thickness, dopant precipitation, and surface topography. The Electrical Test Toolset provides rapid and accurate electrical performance and electrical parametric testing capabilities for semiconductor wafers. The machine also includes a Microelectronics Parametric Testing Toolset for measuring individual chip performance. HP 4280A Wafer Testing and Metrology Tool is designed to provide maximum accuracy and precision in the testing and characterization of semiconductor wafers. It features advanced software functions and user interfaces to facilitate identification, measurement and simulation of complex electrical and physical characteristics. The asset is also equipped with an integrated environmental chamber, enabling temperature testing of wafer characteristics. This chamber can also be used to simulate test conditions in R&D laboratories or in production environments. The model also incorporates state-of-the-art video microscopy, for measured depth measurement of defects and defects on wafers. This allows for accurate defect depth measurement without needing to physically touch the wafers, minimizing the risk of contamination or damage to the wafer. AGILENT 4280A Wafer Testing and Metrology Equipment is a versatile and easy-to-use multi-purpose device for those needing highly accurate and detailed wafer metrology and test data. It offers a user-friendly environment, fast throughput, and comprehensive metrology and electrical parametric characterization. With its wide range of features and options, it is a great choice for any semiconductor fabrication facility.