Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E3160-66522 #191012 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E3160-66522 wafer testing and metrology system is designed to provide fast, highly accurate and reliable measurements of wafers during test and production processes for semiconductor and other industries. It features an integrated optical microscope, CCD (charge-coupled device) scanning, and a unique user-friendly user interface that makes HP E3160-66522 easy to operate. The microscope has a motorized stage that facilitates automatic positioning of wafers for various testing conditions. This allows for maximum throughput, fast measurements and data collection. A CCD scanner is integrated with the microscope allowing for high throughput and low noise when capturing data from a variety of wafer surface features. Additionally, the CCD scanner has several built-in imaging options that provide superior repeatability, accuracy and resolution. The user interface provides a simple point-and-click interface allowing operators to quickly and easily understand the system's features and capabilities. Additionally, the user-friendly display helps to quickly provide the user with the most current information about the test parameters and results. AGILENT E3160-66522 operates through the use of two key external controllers - a CPU motherboard and an I/O board. The CPU board includes memory, processor, and external I/O cards. The motherboard's CPU provides a powerful 32-bit processor and is capable of running sophisticated test algorithms. Meanwhile, the I/O board is designed to meet the needs of high end metrology, providing the flexibility to connect and interface to a variety of sensors and controllers. Overall, E3160-66522 system provides fast, accurate and reliable measurements of wafers in different test and production environments while offering a user-friendly interface. It is an ideal solution for wafer testing and metrology needs.