Used AMAT / APPLIED MATERIALS DFinder2 #9293619 for sale

AMAT / APPLIED MATERIALS DFinder2
ID: 9293619
Wafer Size: 12"
Vintage: 2011
Dark field inspection system, 12" 2011 vintage.
AMAT / APPLIED MATERIALS DFinder2 is an industry-leading piece of automated wafer testing equipment and metrology. It is specifically geared towards the development of innovative, reliable, and cost-effective semiconductor wafers. The equipment enables users to measure and inspect wafers quickly and accurately to ensure stringent manufacturing requirements are met. AMAT DFinder2 offers best-in-class automation and accuracy through its advanced software and hardware design, with a focus on delivering fast, precise, and repeatable results. On the hardware side, the system includes high performance dual-axis microscope heads, dynamic beam profiling, an integrated motorized handling unit, and an easy-to-use graphical interface for complex metrology. On the software side, the machine employs sophisticated algorithms and AI to allow fast and robust results with consistent repeatability. APPLIED MATERIALS D-FINDER2 is designed to measure and inspect critical aspects of next-generation chips, such as line edge roughness, line widths, and linewidth pavements. It provides fast tests for parametric yield and process control, in addition to static and dynamic measurements. The tool includes several features that allow customers to easily integrate into their manufacturing process. These features include auto-calibration, auto-learning, automated defect inspection as well as real-time analysis of CD, OPC, OLS, and OLC measurements. AMAT D-FINDER2 asset is ideal for users who require high-speed, high-precision wafer testing and inspection. It also provides a powerful metrology platform that can handle complex measurements for emerging technologies. The model is perfectly suited to semiconductor product development and large-scale production. With its robust and advanced technology, APPLIED MATERIALS DFinder2 is a reliable choice for wafer testing and metrology.
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