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Wafer Testing And Metrology
AMAT / APPLIED MATERIALS
NanoSEM 3D
#293764088
Used AMAT / APPLIED MATERIALS NanoSEM 3D #293764088 for sale
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Wafer Testing And Metrology
Manufacturer
AMAT / APPLIED MATERIALS
Model
NanoSEM 3D
Equipment Details
Reviews
ID:
293764088
Wafer Size:
6"
Vintage:
2001
Critical Dimension Scanning Electron Microscope (CD-SEM), 6" 2001 vintage.
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