Used AMAT / APPLIED MATERIALS NANOSEM 3D #9233059 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D is an automated wafer testing and metrology equipment designed for observing and measuring very small structures. This system consists of a powerful electron beam microscope capable of resolving features as small as .005 μm, enabling operators to make exact measurements of tiny components. Nanosem utilizes a variety of technologies, from imaging and spectroscopic analysis to analytical and resolved scanning electron microscopy (SEM), for inspecting and characterizing feature sizes, shapes and composition. AMAT NANOSEM 3D is capable of imaging and analyzing samples at up to ten thousand times their original magnification and in less than 30 seconds. It allows users to look beyond the features of the sample, while providing highly accurate depth imaging, due to the high strength of its electron beam. Additionally, the unit includes an energy dispersive spectrometer (EDS) which can detect and measure the composition and concentrations of the sample material. This orientation further enables rapid yet detailed elemental analyses in the form of a micrograph, giving researchers the power to recognize material and topographical signs that are sometimes not easily visible to other methods. APPLIED MATERIALS NANOSEM 3D also offers an advanced automated wafer testing and metrology application for semiconductor-level analysis. The machine utilizes an image analysis package that is tailored for quickly analyzing masked and individual transistor components. The tool's automated feature recognition not only enables fast analysis, but also reduces user interference to enhance reliability. To further guarantee high precision metrology measurements, NANOSEM 3D also includes an automated 3D laser profilometer, providing users with high accuracy dimensional information of the sample. AMAT / APPLIED MATERIALS NANOSEM 3D is a powerful addition to any laboratory interested in accurately inspecting and measuring small-scale features. Its high speed scanning and operation continuously ensure correct completed analysis which can be saved for future reference. With its efficient operation and reliable automated analysis, AMAT NANOSEM 3D is an ideal tool for research into microelectronic components and devices.