Used AMAT / APPLIED MATERIALS NANOSEM 3D #9284714 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D wafer testing and metrology equipment is a powerful tool for enhancing wafer production and improving device performance. This system provides precise samples for physical, electrical and thermal measurement. It is an invaluable tool for industry researchers seeking to develop new materials and production processes. AMAT NANOSEM 3D unit utilizes several different technologies to measure and analyze a variety of materials' properties. Its advanced microscopic imaging technology can measure the dimensions of feature sizes down to 25nm. Its integrated metrology capabilities can identify and measure features on both surfaces of the wafer. The machine also features a range of integrated optical and thermal measurement technologies. This tool's comprehensive metrology capabilities include optical scanning, electrical/thermal-assisted scanning, and scanning electron microscopy. This asset has the ability to scan a wide variety of sample sizes and materials, including both single and double-sided wafers. These capabilities allow for precise characterization of device performance. APPLIED MATERIALS NANOSEM 3D model is also equipped with an intelligent defect recognition equipment. This system can accurately recognize and identify defects on wafer surfaces. By identifying these defects, researchers can reduce the time it takes to identify problem areas in their devices and can reduce costly production failures due to poor device performance. This unit also offers advanced process control capabilities. It can observe process conditions and adjust parameters to provide optimal device performance. This machine also can simulate and predict wafer process performance. This advanced process control feature helps to reduce reject rates and improve device quality. NANOSEM 3D tool is ideal for device manufacturers who are seeking to develop advanced materials and production processes. This powerful wafer testing and metrology asset is capable of providing precise samples and accurate measurements. Its comprehensive metrology and process control capabilities ensure efficient and reliable device production.