Used AMAT / APPLIED MATERIALS NANOSEM 3D #9293620 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D is an advanced wafer testing and metrology equipment that utilizes a combination of 2D and 3D technologies to produce detailed defect imaging images. It features a high-powered electron beam that can be used to create ultra-high resolution 2D images with thicknesses down to a single nanometer. This unprecedented resolution enables the quicker identification and subsequent analysis of wafer-level defects than ever before. AMAT NANOSEM 3D system employs high-resolution digital signal capture (DSC) to capture tiny changes in the electrical current of transistors and devices on microscopic level. This enables the unit to detect potential defects that would have gone unnoticed in a traditional image produced by optical microscopes. As well as DSC, APPLIED MATERIALS NANOSEM 3D machine also integrates the MRC (Metrology Raster Capture) technology to produce a 3D image to facilitate the analysis of subtle changes in the structure of the dielectric layers on the surface of the substrate. The MRC technology utilizes powerful laser beams to "write" a pattern on the surface, providing a fiducial marker to highlight different materials and defects. Using both 3D imaging technologies, NANOSEM 3D tool can monitor real-time measurements of product variability with ultra-high resolution while detecting nanometer scale-level abnormal patterns. This enables product uniformity to be analyzed at a detailed level, with quick and effective detection of subtle defects. The asset also provides visualizations with the ability to "toggle" betw een 2D and 3D views to identify possible physical defects. AMAT / APPLIED MATERIALS NANOSEM 3D model is designed to be easy to operate, with a user-friendly user interface. The equipment can be customized according to user preferences, drivers and post-processing for complete control and automation of data analysis. It also includes an embedded scripting language that enables users to create customized scripts for data collection, analysis and data sharing. All in all, AMAT NANOSEM 3D system is an advanced wafer testing and metrology solution that combines ultra-precise, high-resolution imaging with powerful metrology and defect detection tools. The combination of powerful 2D and 3D imaging technology, real-time measurements and automated analysis create a powerful unit that provide users with unparalleled image resolution and defect detection capabilities.