Used AMAT / APPLIED MATERIALS NANOSEM 3D #9353975 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D wafer testing and metrology equipment is a highly advanced tool for characterization, process control, and advanced failure analysis of semiconductor devices, nanomaterials, and materials with nanoscale features. The system combines innovative hardware and software features to facilitate ultra-high-resolution 3D microscopy. The hardware includes a low-vacuum ultra-high-resolution field emission scanning electron microscope (FE-SEM) with an optional monochroma feature, a high-vacuum secondary electron (SE) detector, an in-column retractable imaging optics chamber, an Associated Vacuum Technologies (AVT) gas cabinet, and a custom applied motion motionless particle injector (MPI). This combination of hardware allows for high-resolution imaging of devices at nanoscale resolutions. AMAT NANOSEM 3D unit can achieve a full resolution of 1 nanometer, or 0.0001mm, allowing for extremely detailed characterization of materials and structures. The machine also includes other useful software and systems for a multitude of analytical and imaging tasks. An integrated spectroscopy tool allows for energy-dispersive spectroscopy (EDS), which can be used to analyze the composition of materials to the nanoscale. Automated filtering and contrast enhancement technologies are also available, giving users the ability to analyze large datasets quickly and easily. The asset also includes numerous QC and process control features. It has integrated defect detection capabilities, providing users with the ability to detect and isolate defects on the nanoscale. An integrated stage control model allows for precise movement and positioning of the sample, with both manual and automated capabilities. Finally, APPLIED MATERIALS NANOSEM 3D provides users with a powerful suite of failure analysis tools. Its automated software allows for the analysis of fault isolation, hotspot analysis, electrical failure analysis, and a range of other fault analysis tasks. In conclusion, NANOSEM 3D wafer testing and metrology equipment is an advanced, integrated system for characterizing, controlling, and analyzing materials at the nanoscale. This unit is highly precise and contains a range of hardware and software features for analysis, metrology, and failure analysis tasks.