Used AMAT / APPLIED MATERIALS NANOSEM 3D #9357538 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D
ID: 9357538
Critical Dimension Scanning Electron Microscope (CD-SEM).
AMAT / APPLIED MATERIALS NANOSEM 3D is a state-of-the-art wafer testing and metrology equipment designed specifically to meet the needs of advanced process technology development. By using 3-dimensional imaging and analysis, it is capable of measuring and characterizing features on the nanoscale. AMAT NANOSEM 3D is equipped with an advanced multi-channel SEM (scanning electron microscope) with a high-resolution X-ray detector that can produce three-dimensional images with a resolution down to nanoscale. Additionally, the system includes a variable-angle z-stage that can be adjusted to provide a variety of imaging angles and depths. In addition to being equipped with an advanced SEM, APPLIED MATERIALS NANOSEM 3D also offers several other capabilities. For one, it is equipped with an optical microscope that can analyze the topography of a sample with a resolution of 3nm or better. This microscope can also measure orientation angles and tilt angles of a sample. The unit's software also allows for accurate measurements and characterization of wafer testing and/or metrology data. It is capable of measuring both 2D and 3D data, which helps to minimize errors in the results. Additionally, NANOSEM 3D has the ability to process a variety of different materials, such as semiconductors, metals, and insulators. AMAT / APPLIED MATERIALS NANOSEM 3D is a highly sophisticated machine that is capable of providing unparalleled accuracy and precision in wafer testing and metrology. Its ability to measure and characterize features down to nanoscale levels is unparalleled in the industry. As a result, this tool has become a powerful tool for process technology development, helping to reduce errors and improve yields.
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