Used AMAT / APPLIED MATERIALS NANOSEM 3D #9390681 for sale

AMAT / APPLIED MATERIALS NANOSEM 3D is a wafer testing and metrology equipment designed to provide comprehensive lithography production testing and failure analysis capabilities. It is equipped with a variety of features and capabilities that enable users to accurately and efficiently characterize both single and multi-level structures on semiconductor substrates, including front-end and interconnect structures. AMAT NANOSEM 3D features a multiprobe nanomanipulating stage for automated scanning of multiple probes at a high speed, and a high-resolution digital image capture system for precise measurements and analysis. The unit is capable of capturing images of up to 1024 X 1024 pixels in both two- and three-dimensional (3D) formats, which makes it ideal for customers who need to assess minuteness deviations, differences in thickness and material deposits, and structural topography of the substrate. The machine is built with a range of software options, including Optical Tool Kit, which provides automated pre-and post-processing tools of data files, as well as software support for direct data import and export, making it easier to analyze test data. Furthermore, the tool integrates with a variety of software packages, such as the Scanning Nanoprobe Manipulating Software (SNMS) which enables the user to precisely navigate a scanning probe to the given substrate. APPLIED MATERIALS NANOSEM 3D also features integrated process monitoring and control systems for efficient production monitoring and data logging, as well as thermal control on temperature-sensitive substrates to ensure a stable wafer process. Additionally, the asset features a mechanical actuator for X/Y motion and a monitor for closed-loop control of tilt and scan speeds. In addition, NANOSEM 3D can be applied to a wide variety of processes, including deep trench etching, CMP, metal metrology, and high-density dielectrics. It is built to provide the accuracy and repeatability necessary to maintain quality control of critical process steps and quality standards.