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Wafer Testing And Metrology
AMAT / APPLIED MATERIALS
Reticle NanoSEM 3D
#293643450
Used AMAT / APPLIED MATERIALS Reticle NanoSEM 3D #293643450 for sale
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Wafer Testing And Metrology
Manufacturer
AMAT / APPLIED MATERIALS
Model
Reticle NanoSEM 3D
Equipment Details
Reviews
ID:
293643450
Critical Dimension Scanning Electron Microscope (CD-SEM) Reticle SMIF, 6" Dry pump Standing operator console SECS / GEM and HSMS Mini environment Optical microscope lens: FOV 450 FOV 6000 Power supply: 400-208 V, 3 Phase, 50Hz.
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