Used AMAT / APPLIED MATERIALS Reticle NanoSEM 3D #293643450 for sale

AMAT / APPLIED MATERIALS Reticle NanoSEM 3D is a next-generation wafer testing and metrology equipment designed for advanced failure analysis. It is based on the worldwide recognized Field Emission Scanning Electron Microscopy (FESEM) system. AMAT Reticle NanoSEM 3D is an automated sample testing solution which offers high resolution performance and enables fast, accurate and cost effective process control. It features a low kV imaging detector which provides high resolution imaging and a high kV detector suited for imaging back side features. APPLIED MATERIALS Reticle NanoSEM 3D features a sensitive highest resolution backside imaging detector, which provides an image of the sample surface that can be used to detect failure sites. Reticle NanoSEM 3D enables failure analysis, metrology and defect location with a single unit. The unique 3D capability of the machine means that it is capable of detecting and localizing several 3D artifacts and feature faults at the same time. AMAT / APPLIED MATERIALS Reticle NanoSEM 3D can provide advanced analysis of dielectric and metal layers, as well as analyzing transistors, capacitors and more. AMAT Reticle NanoSEM 3D provides a variety of features which allow it to perform comprehensive fault localization. The tool offers top and side imaging, spectroscopy and signal measurement modes, as well as scanning deflectometry, electron backscatter diffraction (EBSD) and transmission electron microscopy (TEM). APPLIED MATERIALS Reticle NanoSEM 3D also features automated sample pad mapping, allowing for multiple patterns on one wafer. Reticle NanoSEM 3D can be configured for specific applications, allowing users to customize it to their particular analysis needs. It has a wide range of available accessories, including gas lines and cryogenic samples. AMAT / APPLIED MATERIALS Reticle NanoSEM 3D is designed to efficiently acquire analysis data from samples in a wide range of formats, including contact and non-contact. AMAT Reticle NanoSEM 3D is a revolutionary wafer testing and metrology asset for advanced failure analysis. It is designed for easy operation, with a user-friendly graphical user interface, and can be quickly set-up and configured for specific applications. Its versatile features, including 3D capability, allow it to perform comprehensive failure localization, which is invaluable in production environments. With its low kV imaging detector and versatile sample handling, APPLIED MATERIALS Reticle NanoSEM 3D is an ideal model for efficient process control.