Used AMAT / APPLIED MATERIALS Reticle NanoSEM 3D #9225946 for sale
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Scanning Electron Microscope (SEM) Process: Mask critical dimension (CD) measurement Main module Operation panel Network panel Pump UPS 2004 vintage.
AMAT / APPLIED MATERIALS Reticle NanoSEM 3D is an advanced wafer testing and metrology equipment that provides superior performance for ultra-high resolution 3D imaging and analysis. The system offers unparalleled precision and accuracy, allowing users to perform a variety of measurements and tasks on delicate wafer materials. AMAT Reticle NanoSEM 3D utilizes a scanning electron microscope (SEM) to conduct imaging and measurements with nanometer resolution. It features a high resolution low kV gun for more precise imaging and enhanced charging in materials and surfaces. It also has a sample stage motorized in X, Y, and Z axes, making it versatile and suitable for a variety of requirements. APPLIED MATERIALS Reticle NanoSEM 3D includes a variety of features to ensure precision and accuracy in imaging. These include a wide range of magnification options (up to 50,000x) for both 3D imaging and scanning, as well as the ability to generate high resolution images with a field of view ranging from micrometers to tens of micrometers. It is also equipped with an electron beam focusing unit and gas-filled ion column that allow for a wide range of energy and depth possibilities. In addition to its imaging capabilities, Reticle NanoSEM 3D is also equipped with several metrology tools to enhance its functionality. These include a variety of detectors, such as a secondary electron detector, backscatter electron detector, and energy dispersive X-ray detector, as well as an automated optical alignment machine. AMAT / APPLIED MATERIALS Reticle NanoSEM 3D also features an intuitive user interface and software suite. The software provides advanced data analysis, automation, visualization, and collaboration features, allowing users to fully maximize and benefit from the tool's capabilities. Additionally, the software offers reporting capabilities to ensure data accuracy and completeness for complex data sets and samples. AMAT Reticle NanoSEM 3D is an advanced wafer testing and metrology asset that provides incredible imaging and metrology capabilities with cutting-edge features and intuitive software solutions. With its superior accuracy and performance, APPLIED MATERIALS Reticle NanoSEM 3D is the perfect model for achieving precise results in the most delicate of tasks and materials.
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