Used AMAT / APPLIED MATERIALS Reticle NanoSEM 3D #9269031 for sale

AMAT / APPLIED MATERIALS Reticle NanoSEM 3D is the most advanced wafer testing and metrology equipment for semiconductor research and development. It provides unprecedented 3D views of the structures on semiconductor wafers. The system enables designers and scientists to analyze chip structures quickly and accurately to understand electrical failure modes and optimize design. AMAT Reticle NanoSEM 3D features a large chamber equipped with a high-performance electron gun, digital signal-processing electronics, motion controllers, and other components to maximize imaging and analysis of critical features. The chamber is vacuum sealed to enable wafer monochromatic scanning and full-field imaging. It has an integrated NanoSIMS imaging unit, which operates with an integrated NanoBioCM machine to measure the chemical parameters of the structures. The tool also includes a reticle scanner that can inspect up to 28 reticles at a time. To ensure accurate and reliable imaging, the asset includes a patent-pending 3D stitching algorithm to generate highly-accurate 3D images. It uses two electron beam columns to capture the fine details of structures, while the advanced imaging software features high-speed analysis and image correction. This ensures that the images are accurate and the data can be used with confidence. APPLIED MATERIALS Reticle NanoSEM 3D is the ideal tool for electrical failure analysis and wafer metrology. It provides researchers with high-quality 3D images with sub-nanometer accuracy that can be used for pattern recognition, device characterization, and process monitoring. The model is easy to use and can be integrated into existing wafer research and development processes. It is equipped with a remote monitoring facility that allows users to monitor its performance from any location. This feature ensures that the equipment always functions at peak performance and is available when needed. Reticle NanoSEM 3D is the ultimate wafer testing and metrology system for semiconductor research and development. Its suite of advanced features, robust performance, and cost-effectiveness make it the ideal choice for researchers and designers who demand the highest quality and reliability from their work.