Used AMAT / APPLIED MATERIALS VeraSEM 3D #293668731 for sale

AMAT / APPLIED MATERIALS VeraSEM 3D Wafer Testing and Metrology Equipment is a highly advanced tool for wafer testing and metrology. It is used by research laboratories, semiconductor manufacturers, and process engineers to accurately measure and characterize the 3-dimensional features of semiconductor wafers, solid-state memory chips, and other semiconductor devices. AMAT VeraSEM 3D system is composed of a number of components, including the MetaSEM G4 high resolution SEM (Scanning Electron Microscope) cryo-cooled specimen view, the MetaSEM Magnetron Sputtering Station, and the High Resolution Optical Microscope. The SEM utilizes electron beam technology to identify the exact features of the wafer or device under inspection. The MetaSEM G4 high resolution SEM cryo-cooled specimen chamber provides precise control of sample temperature and operating conditions. The magnetron sputtering station is used to deposit thin films onto the wafers prior to imaging. The high resolution optical microscope allows the user to accurately inspect and measure the topography and surface roughness of the samples. In addition to these components, APPLIED MATERIALS VeraSEM 3D also includes a number of advanced software and hardware systems, such as the Stereology Analysis Unit, the Automated Sample Preparation Machine, and the Pattern Recognition Software. The Stereology Analysis Tool is utilized to automatically identify the features of the wafer, such as the size, shape, and orientation of features on the wafer. The Automated Sample Preparation Asset allows the user to quickly and accurately prepare the samples for imaging. The Pattern Recognition Software is used to identify patterns, such as the patterning of diodes or transistors on the wafers. VeraSEM 3D Wafer Testing and Metrology Model is an invaluable resource to research laboratories, semiconductor manufacturers, and process engineers. It provides fast, accurate, and reliable measurements and characterizations of wafers and other semiconductor devices. Thanks to its advanced components and software, AMAT / APPLIED MATERIALS VeraSEM 3D is able to identify the exact features of the wafer and quickly prepare samples for imaging. This equipment is an essential tool for semiconductor device fabrication and inspection.