Used AMAT / APPLIED MATERIALS VeraSEM 3D #9392146 for sale

AMAT / APPLIED MATERIALS VeraSEM 3D is a powerful wafer testing and metrology equipment that enables users to quickly and accurately measure electrical, physical and material properties of wafers and carriers. The system features a high-throughput, advanced design that maximizes efficiency in both manual and automated operations. The integrated automation software and control unit provide advanced settings for automatic control of test parameters and analysis. AMAT VeraSEM 3D incorporates a vacuum-based technology for non-contact surface scanning, allowing for high-accuracy testing of microelectronic devices in various advanced applications. The machine's high-resolution imaging and analysis capabilities enable users to accurately evaluate the surface of a wafer, resulting in data that is free of anomalies. This enables enhanced process control and helps reduce process variations. In addition, its ultra-high frequency drive technology provides a maximum scanning resolution of 500nm, allowing for precise quantitative analysis of surface characteristics. Furthermore, APPLIED MATERIALS VeraSEM 3D is equipped with an automated optical metrology feature, which allows users to capture high-resolution images of wafer surfaces. This feature provides a comprehensive visual assessment of features and defects, while also providing a real-time view of the surface. This tool also features a user-friendly interface that allows for easy operation, ensuring maximum efficiency and convenience. Moreover, VeraSEM 3D offers a variety of advanced data analysis capabilities, including 3D surface characterization, wide range parameter extraction, and overlay metrology. This feature enables users to quickly and easily explore the overall characteristics of a wafer surface, as well as to assess its level of performance and detect any potential problems. Overall, AMAT / APPLIED MATERIALS VeraSEM 3D is a powerful and highly-accurate wafer testing and metrology asset that enables users to quickly and accurately measure electrical, physical, and material characteristics of wafers and carriers. It features an integrated automation software, a user-friendly interface, and an automated optical metrology feature, making it a great choice for any application.