Used AMAT Sting II #293625703 for sale

AMAT Sting II is a wafer testing and metrology equipment developed by Applied Materials Inc. It is used for rapid inspection and metrology of advanced semiconductor devices. Sting II system supports the measurement of the physical properties of the devices with its advanced electrical, thermal, optical and other sensor technologies. It is used for Contact Resistance measurements, Leakage Measurements, Junction Resistance Measurements, Junction Capacitance Measurements, and other similar parameter measurements. AMAT Sting II unit incorporates an advanced machine controller to facilitate efficient data flow from the sensors to the host computer, allowing rapid characterization and metrology of a device. The tool also contains a high-resolution imaging asset which is used to capture the physical layout of a device. By measuring the physical layouts, engineers can measure the distances and parameters of the device layers accurately. Sting II model is also equipped with the Nanomanipulator which is used to perform high-precision measurements on nanometer and sub-nanometer scale geometries. This enables engineers and manufacturers to accurately analyze and characterize the physical and electrical properties of their devices. AMAT Sting II equipment also incorporates several software packages that are used to analyze data and calculate the complex electrical properties of a device. The software includes a data management and analysis suite, which is used to accumulate, visualize and analyze the data, as well as software for the simulation of the conductivity of devices. The interface of Sting II system is user-friendly allowing operators to quickly set up and execute tests with minimal setup time. This allows engineers and manufacturers to quickly and accurately characterize their devices and assess their performance in only minutes. In summary, AMAT Sting II is a powerful and user-friendly wafer testing and metrology unit that can accurately measure the physical and electrical properties of advanced semiconductor devices. It provides engineers and manufacturers with a robust platform to quickly and efficiently characterize their devices in order to accurately assess their performance.