Used ASM Dragon 2300 #9290805 for sale

ID: 9290805
Wafer Size: 12"
PECVD System, 12" 2006 vintage.
ASM Dragon 2300 equipment is a state-of-the-art wafer testing and metrology tool designed for the lithography and inspection processes. It offers a high-end optical and scanning capability that is suitable for testing a variety of semiconductor-related materials including thin-film transistors, silicon on insulators (SOI) and organic light-emitting diodes (OLEDs). The system is capable of reducing wafer testing time dramatically as it enables asynchronous metrology of multiple wafers at the same time. Dragon 2300 features a unique dual-axis scanning unit with a nano-precision rotating head that is integrated with a two-stage video microscope. This configuration ensures a fast and consistent sampling of the wafer surfaces, allowing for sub-micron-level measurements which are necessary for inspecting the wafer's topography. Additionally, the device is equipped with a high-resolution imaging sensor and software for characterizing optical features such as texture, roughness, and surface elevation. Another useful feature of ASM Dragon 2300 furnishes is its powerful embedded software. This includes a graphic user interface (GUI) that simplifies user interaction with the machine and an automated image-processing routine for real-time evaluation of the wafer surface. The software can also extend the measurements to other parameters like wafer defectivity. In addition, Dragon 2300 provides an integrated inspection solution for measuring the critical dimensional parameters, such as gap, width, and depth with extreme precision. This feature enables process control and optimization, which in turn reduce the cost of wafer production and improve yield quality. ASM Dragon 2300 also offers the option of performing defect analysis and review in addition to dimensional metrology. This can be done using the high-resolution imaging feature as well as the automated software routines. Dragon 2300 tool also includes a fully automated asset for inspecting and analyzing wafers quickly and efficiently. This includes data logging capabilities, part localization, and ability to control process parameters for greater consistency and repeatability. To summarize, ASM Dragon 2300 wafer testing and metrology model offers an advanced state-of-the-art tool for lithography and wafer inspection. Its features allow for quick and accurate evaluation of the wafers for any defects, ensuring efficient manufacturing of complex semiconductor devices.
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