Used ASM Eagle M #9401027 for sale

ASM Eagle M
ID: 9401027
Measurement system.
ASM Eagle M is a sophisticated wafer testing and metrology equipment designed for the most demanding semiconductor production and quality control applications. This robust, fully-automated solution combines superior 3D metrology with advanced silicon device testing and probing capabilities. With Eagle M system, wafers are loaded into one of two dedicated transport carriers and placed onto a test bed that is equipped with 926 electrical probes. This exact positioning unit ensures accuracy and repeatability, and allows for vastly improved testing throughput. ASM Eagle M also includes a high-precision vision machine, which uses both two-dimensional scan-and-tilt technology and 3D microscopy for the most accurate image acquisition and analysis. This technology is especially useful for monitoring defect identification and wafer defect disposition. Advanced on-board software provides real-time wafer characterization with automated wafer alignment and best-available defect-free die mapping. This reliable tool provides users with not only greater data accuracy but also improved die-level test yield and defect-free production. Eagle M also features a wide variety of options that offer expanded capabilities in wafer probing, wafer processing, test selection, and mapping of defect-free die. The automated die-level test sorting options allow users to easily review test results, prioritize die test selection, and customize analysis parameters. This tool also provides automated patch keying, in-plane stitching/post-processing of results, and automatic volume identification from test results. In addition, ASM Eagle M offers versatile connectivity with a variety of standard interfaces for networking to external devices. These include USB, Ethernet, and optional IEEE 1394 interface for fast connectivity and device control. The on-board software also includes a comprehensive element-based editor for text-based test results programming. Eagle M is a comprehensive testing and metrology solution for advanced semiconductor production and quality control. With its many features and options, this asset provides reliable testing, improved throughput, and superior defect detection.
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