Used ASML YieldStar S100 #293625705 for sale

ASML YieldStar S100 is a wafer testing and metrology equipment that is used for the characterization and analysis of semiconductor devices. The system features advanced laser interferometry for precision metrology as well as high-throughput efficiency and advanced software for data processing and analysis. ASML YIELDSTAR S-100 utilizes infrared alignment (IR-LAL) technology to reduce test time and increase accuracy up to ± 10nm. The unit is capable of measuring both 2D and 3D structures on wafer structures. It also utilizes surface characterization techniques such as surface topography, line width measurement, roughness mapping, and defect imaging. The YieldStar has a large dynamic range, excellent signal-to-noise ratio, and high resolution which allows it to detect very small variations in wafer structures. It also has the capability to perform non-destructive testing on wafers and can be used to quickly detect very small process changes that may affect the device's performance. The machine is also capable of providing detailed reports and analysis results, allowing for quick and effective decision-making. Furthermore, reports can be tailored to the specific application needs. Additionally, an extensive library of measurement algorithms allows for detailed accuracy requirements to be met without extensive programming or calibration. In addition to these features, the YieldStar also offers an intuitive user interface and on-screen instructions for step-by-step operations. It also has excellent remote control and data transfer capabilities, allowing for data to be stored, analyzed, and exported off-site. Overall, YieldStar S100 is a highly advanced wafer testing and metrology tool that has excellent accuracy and throughput capabilities, as well as an intuitive user interface and extensive library of measurement algorithms. It is an ideal solution for characterization and analysis of semiconductor devices.