Used ASML YieldStar S100B #293641963 for sale

ASML YieldStar S100B is a wafer testing and metrology equipment designed for on-product measurement of electrical, physical and chemical characteristics. It is used to identify and remedy problems in the production process, analyze and optimize silicon wafers in real time, and allow design changes without the need to re-fabricate the wafer. The system features advanced hardware and software capabilities, including non-contact optical and laser sensors, three-dimensional scanning, and high accuracy metrology measurement systems. YieldStar S100B is capable of capturing high resolution images of the wafer surface, measuring electrical parameters including resistivity and capacitance, and mechanical properties such as thickness and stress. ASML YieldStar S100B also has integrated fault analysis and defect classification for identifying sources of errors in production processes. This allows for effective supplier quality control, as well as process improvements that can lead to increased wafer yield. The unit has a variety of user-friendly graphical user interfaces that facilitate the scanning and analysis of large areas quickly and easily. It can be used in either a local or remote configuration, and its portability allows for the easy relocation between measurement labs and cleanroom environments. YieldStar S100B is ideal for laboratories, production lines and semiconductor device manufacturing, as it is engineered to meet the challenging demands of volume inspection and process optimization. With industry leading accuracy and speed, the machine is a cost-effective and reliable choice for testing and metrology departments.