Used ASML YieldStar S200 #9193316 for sale

ASML YieldStar S200 is a wafer testing and metrology equipment used to monitor the process of preparing and making semiconductor chips. This system inspects wafers, identifies defects, and can measure certain characteristics of wafer features. It allows for analysis and tracking of wafers throughout the production process to ensure that they meet the desired specifications. The unit is designed for total process control, providing full wafer-level metrology for improved yield and product quality. It includes a scanning electron microscope (SEM) and several other components for quantitative studies of wafer defects and shapes. Its proven automated machine offers the highest available image quality for reliable quantitative analyses of wafer patterns. The tool has an extremely sensitive imaging asset, allowing for the detection of extremely small defects, at any desired depth of focus. ASML YIELDSTAR S 200 provides high throughput wafer testing and metrology. It offers automated analysis of small feature defects, allowing for efficient defect detection and review. The model also allows for the easy export of data to allow for further analysis. This equipment also offers powerful data-signal analysis capabilities that enable high-accuracy measurements on dense and complex patterns. The system includes an advanced graphical user interface (GUI) allows for quick viewing of the microscope images. The operational parameters for the unit are easily set on this interface. Along with this, it also provides detailed reports that display information including average analysis speed, precision of measurements, and defect rating. YieldStar S200 is compatible with both 200 and 300mm wafers, making it ideal for production of devices with different feature sizes. It is designed with robust components that enable process stability even over long production runs. This machine utilizes dynamic noise control technology to reduce the noise level of SEM imaging during production. This also reduces the time required for terabytes of data to be processed. Overall, YIELDSTAR S 200 is a leading wafer testing and metrology tool. Its ability to analyze and track wafers over the production process ensures that they meet the desired specifications. It offers high throughput wafer testing and metrology, robust components, and superior defect detection capabilities. This asset is ideal for production of devices with different feature sizes and ensures process stability with dynamic noise control technology.