Used ASML YieldStar S200B #293655834 for sale

ASML YieldStar S200B
ID: 293655834
Overlay measurement system.
ASML YieldStar S200B is an advanced wafer testing and metrology equipment manufactured by ASML, a leader in the semiconductor industry. The system is specifically designed for equipment manufacturers and sub-fab process characterization, helping to optimize yield, reduce cost, and boost performance of the latest semiconductor designs. The unit enables rapid, room temperature testing of wafers up to 200 mm in diameter with a high level of both precision and repeatability, allowing users to adjust their process control parameters to obtain optimal results. YieldStar S200B features a reliable 200 mm x 200 mm optics staging table and advanced scanning algorithm for wafer metrology. This machine also comes with a high-precision shutter wheel and advanced optics to accurately measure the edge-to-edge thickness and average profile of a semiconductor wafer. The high-accuracy motion control stage with repeatable accuracy to within 1µm/minute allows for precise operation in sub-micron wafer processes. ASML YieldStar S200B also features an intuitive user interface for optimum control and monitoring of process performance. The tool can be used with various imaging technologies and includes a wide range of calibration models, allowing for customization depending on the user's application needs. The comprehensive AlignCam software adds further accuracy and reliability to the power of the metrology asset. YieldStar S200B is an excellent choice for wafer testing and metrology, as it can quickly detect minute changes in link height and surface roughness of wafers. The combination of accuracy, versatility, and repeatability makes ASML YieldStar S200B an attractive choice for assembling and integrating today's high-density integrated circuits. The model has been proven to speed up the production cycle, improve signal integrity, and increase the overall reliability of the process.
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