Used ASML YieldStar S200B #293670141 for sale

ASML YieldStar S200B is a wafer testing and metrology equipment designed to provide improved metrology capabilities to guarantee high yields and reliable product performance. YieldStar S200B system leverages advanced technology to enable improved wafer testing capabilities. It offers an automated, high-resolution metrology unit for measuring properties such as thickness and stress. Furthermore, the machine includes a high-speed imaging module, providing an enhanced presence in wafer handling. ASML YieldStar S200B also incorporates an advanced optical tool, allowing it to measure extremely small features and structures that are difficult to detect with conventional metrology systems. YieldStar S200B also features a unique "SmartPSM" stage that allows for precise wafer alignment and orientation, as well as a stage-less architecture that eliminates the need for manual reconfigurability. This means that the S200B is capable of capturing and measuring a wide range of wafer properties in the same asset. Moreover, ASML YieldStar S200B has an automated detection and measurement model, allowing it to quickly detect and measure different results in one single scanning step. YieldStar S200B makes it easier to analyze and comprehend complex and challenging wafer structures. It also comes with a powerful analytical software package that offers comprehensive analysis and reporting capabilities. The software package, when utilized along with ASML YieldStar S200B equipment, creates reliable insights that help organizations understand, measure, and validate fabricated features. In addition, YieldStar S200B is designed for ease of use, allowing users to quickly customize the settings to suit their needs. With its range of metrology capabilities, the system provides high-yielding products while ensuring quick troubleshooting and accurate results. Furthermore, ASML YieldStar S200B meets international quality standards, making it a reliable, cost-effective solution for wafer testing and metrology requirements.