Used ATI WIND AWIS-1200 #293654341 for sale

ATI WIND AWIS-1200 is a wafer testing and metrology equipment designed to recognize and measure semiconductor structures, patterns, and defects from wafers up to 300mm in size. It has a proven reliability for detecting defects and measuring the size, shape, and structure of the parts under any kind of environmental condition. The AWIS- 1200 features a 12Mega Pixel CMOS sensor, RealTime Digital Signal Processing, High Speed Image Acquisition, Digital image signal processing, and a 3 Stage Intelligent Inspection System. The 12 Mega Pixel CMOS Sensor enables high resolution images, capturing detailed patterns on the wafer at high speed. The RealTime Digital Signal Processing helps reduce optical noise, banding, and other kinds of aberrations. This is possible because various signal processing functions are integrated into a single chip with a highly integrated line and pixel buffer. The Digital Image Signal Processing benefits include auto-gain and auto-shutter control, pixel response non-uniformity correction, and gamma correction. These help improve image quality and reduce inspection time significantly. The AWIS-1200 is capable of measuring the widths and lengths of sub-micron patterns with a high degree of accuracy and speed. This is accomplished by its 3 stage inspection unit, which consists of a microscope, interferometer, ellipsometer, and spectrometer. The microscope is used for assessing general surfaces, the interferometer for measuring high-precision features, the ellipsometer for measuring surface topographies and thin films, and the spectrometer for optical analysis of materials. This allows for an accurate assessment of the parts and allows the machine to identify types of defects on the wafer such as pits, trenches, steps, and other defects. The AWIS-1200 has an intuitive and user-friendly interface and a highly advanced software for controlling and analyzing measurements. The software is specifically designed for the included microscope, interferometer, spectrometer, and ellipsometer. It is suitable for both advanced and novice users and is capable of quickly and accurately measuring the characteristics of even the most complex structures. The software also enables automated data collection and processing, thereby improving efficiency and accuracy of measurements. Overall, WIND AWIS-1200 is an excellent wafer testing and metrology tool, providing high-precision analysis and defect detection from wafers up to 300mm in size. Its advanced features and flexibility make it an ideal choice for a wide range of applications.