Used BRUKER-AXS Dektak XT #9255110 for sale

BRUKER-AXS Dektak XT is a high-end equipment designed for wafer testing and metrology. It is built on a large format X-Y Stage, designed to accommodate wafers of various sizes, materials, and thicknesses. The system is equipped with state-of-the-art sensors and a high-speed X-Y scanning mechanism that enable highly accurate wafer measurement. The unit is capable of accurately measuring surface structures, roughnesses, and overall flatness of the sample. BRUKER-AXS DEKTAKXT is able to accurately measure the flatness of the sample over a wide range of keys, from 10 nm to several hundred microns, with a high degree of precision. This makes the machine ideal for a variety of wafer testing and metrology applications, such as advanced surface analysis, wafer defect inspection, and surface defect detection. The tool also features an advanced software suite that enables fast and accurate analysis of wafer data. This software has a user-friendly graphical interface that is designed to make data analysis and reporting simpler. The software provides detailed reports and data summaries, which makes the asset ideal for analyzing a wide range of wafer characteristics. In addition, the model is equipped with an industry-standard reference plane, a critical component for providing accurate results for any metrology application. The reference plane allows for precise measurements of the wafer structure in a number of axes, further enhancing accuracy. Combining with the advanced wafer testing and metrology capabilities of Dektak XT, the equipment is an ideal solution for a wide range of Wafer Testing and Metrology applications. Its robust build and high accuracy make it an excellent choice for a variety of industries, including semiconductor, nanotechnology, and green energy. DEKTAKXT offers an efficient, accurate, and safe way to measure and analyze a wide range of wafer features.